首页> 外文会议>High Performance Devices, 2002. Proceedings. IEEE Lester Eastman Conference on >Design of GaN/AlGaN HEMT class-E power amplifier considering trapping and thermal effects
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Design of GaN/AlGaN HEMT class-E power amplifier considering trapping and thermal effects

机译:考虑陷阱和热效应的GaN / AlGaN HEMT E类功率放大器的设计

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A microwave class-E power amplifier using AlGaN/GaN HEMT as the switching device is reported by incorporating trapping and thermal effects in the large-signal device model. The load network of the class-E amplifier is designed by considering more realistic exponential decay of the drain current during fall time and finite quality factor of the resonant circuit to incorporate the nonidealities of the active device and passive components. With 9 V supply voltage, calculated output power and power conversion efficiency are 89 mW and 58% at 1GHz which decrease to 84 mW and 54% at 3.8 GHz, respectively for a GaN/Al/sub 0.30/Ga/sub 0.70/N HEMT with gate width of 50 /spl mu/m.
机译:通过将捕获和热效应纳入大信号器件模型中,报道了使用AlGaN / GaN HEMT作为开关器件的E类微波功率放大器。 E类放大器的负载网络是通过考虑漏极电流在下降时间期间的更实际的指数衰减以及谐振电路的有限品质因数来设计的,以结合有源器件和无源器件的非理想性。使用9 V电源电压时,对于GaN / Al / sub 0.30 / Ga / sub 0.70 / N HEMT,计算出的输出功率和功率转换效率在1GHz时分别为89 mW和58%,在3.8 GHz时分别降至84 mW和54%闸门宽度为50 / spl mu / m。

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