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A forbidden temperature region for the growth of planar strained InAlGaAs MQW structures for 1.3μm lasers

机译:禁止温度区域,用于平面应变的inalgaas MQW结构的生长为1.3μm激光器

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As part of an investigation of the optimum growth conditions for the preparation of strained MQW InAlGaAs lasers for operation at 1.3μm, one to six quantum well structures, with up to 1.4% strain, have been grown at temperatures in the range 470 to 585°C. Deposition of both digital and bulk alloy layers was carried out in a V8OH system, on two- and three inch n-InP substrates, and growth temperatures were monitored using absorption band-edge thermometry. The basic MQW structures consisted of 10nm lattice matched confinement layers of digital alloy InAlGaAs (~1.0μm bandgap), or bulk InAlAs, bounding 6nm layers of digital alloy In{sub}O.73Al{sub}0.165Ga{sub}0.105 As.
机译:作为在1.3μm下制备紧张的MQW Inalgaas激光器的最佳生长条件的研究的一部分,在470至585°的温度下生长一至六个量子井结构,含有高达1.4%的量子良好的结构C。数字和块状合金层的沉积在V8OH系统中进行,在两英寸和三英寸的N-InP底物上进行,使用吸收带边缘温度监测生长温度。基本的MQW结构由10nm格子匹配的数字合金inalgaas(〜1.0μm带隙)的匹配限制层组成,或散装inlalas,{sub} o.73al {sub} 0.105中的数字合金中的6nm层。

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