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A forbidden temperature region for the growth of planar strained InAlGaAs MQW structures for 1.3 /spl mu/m lasers

机译:1.3 / spl mu / m激光器的平面应变InAlGaAs MQW结构生长的禁区

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As part of an investigation of the optimum growth conditions for the preparation of strained MQW InAlGaAs lasers for operation at 1.3 /spl mu/m, one to six quantum well structures, with up to 1.4% strain, have been grown at temperatures in the range 470 to 585/spl deg/C. Deposition of both digital and bulk alloy layers was carried out in a V80H system, on two- and three inch n-InP substrates, and growth temperatures were monitored using absorption band-edge thermometry. The basic MQW structures consisted of 10 nm lattice matched confinement layers of digital alloy InAlGaAs (/spl sim/1.0 /spl mu/m bandgap), or bulk InAlAs, bounding 6 nm layers of digital alloy In/sub 0.73/Al/sub 0.165/Ga/sub 0.105/As.
机译:作为制备应变MQW InAlGaAs激光器的最佳生长条件的一部分,该激光器以1.3 / spl mu / m的速率工作,在此温度范围内生长了1-6个量子阱结构,应变高达1.4%。 470至585 / spl摄氏度/摄氏度。在V80H系统中在2英寸和3英寸n-InP衬底上进行数字和整体合金层的沉积,并使用吸收带边测温仪监测生长温度。基本的MQW结构由数字合金InAlGaAs(/ spl sim / 1.0 / spl mu / m带隙)或块体InAlAs的10 nm晶格匹配约束层组成,包围了6 nm数字合金In / sub 0.73 / Al / sub 0.165层/ Ga / sub 0.105 / As。

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