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Geometric effect on InAs/GaAs quantum dot lasers analyzed with the aid of EDX mapping

机译:借助EDX映射分析INAS / GAAS量子点激光器的几何效果

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The light-output-current characteristics and temperature stability of quantum dot (QD) lasers with different ridge heights were analyzed with the aid of energy dispersive X-ray (EDX) elementary mapping. The results show that the performance of QD laser with shallow ridge decays due to the lateral carrier spreading.
机译:借助于能量分散X射线(EDX)基本映射,分析了用不同脊高度的量子点(QD)激光的光输出电流特性和温度稳定性。结果表明,由于横向载体扩散,QD激光与浅脊衰减的性能。

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