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Dynamic response of a plastic encapsulated high-g MEMS accelerometer

机译:塑料封装的高G MEMS加速度计的动态响应

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A high-g MEMS accelerometer with double cantilever beams is sandwiched between a glass substrate and a protective cap using wafer level packaging technology, and then die attached and encapsulated in a Kovar header. Encapsulation is a key step to ensure the reliability of high-g MEMS accelerometer. There are currently few detailed reports on the encapsulation of high-g MEMS accelerometers. In this work, the dynamic response of the package structure under high-g shock acceleration is simulated using finite element method. By applying a 50 /spl mu/s half-sine pulse of acceleration with 100,000 g's peak (1 g = 9.8 m/s/sup 2/), results show that the effect of modulus of encapsulant on the output voltage and beam deflection can be ignored. The peak value of output voltage was close to the analytic solution, also for the equivalent stress at the root of beam. The cantilever beams of accelerometer still behave as damped free vibration, but the peak values of output voltage and beam deflection show well linearity with the peak acceleration applied. Encapsulant with elastic modulus 4 GPa is rigid enough to encapsulate the chip.
机译:使用双悬臂梁的高G MEMS加速度计使用晶片水平包装技术夹在玻璃基板和保护帽之间,然后在Kovar头部附接并封装。封装是保证高G MEMS加速度计可靠性的关键步骤。目前还有一些关于高G MEMS加速度计的封装的详细报告。在这项工作中,使用有限元方法模拟了高g冲击加速下的包装结构的动态响应。通过用100,000g峰值施加50 / SPL MU / S半正弦脉冲(1g = 9.8 m / sup 2 /),结果表明,密封剂模量对输出电压和梁偏转的影响可以被忽略。输出电压的峰值靠近分析溶液,也靠在梁根部的等效应力。加速度计的悬臂梁仍然表现为阻尼的自由振动,但输出电压和梁偏转的峰值显示出孔的峰值加速度的线性。具有弹性模量<4 GPA的密封剂足以封装芯片的刚性。

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