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Underfill Interaction with a Pb-Free CSP Assembly Process and Its Effect on Reliability

机译:与无铅CSP装配过程的填补交互及其对可靠性的影响

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In this study, we examined the interactions of three types of underfill materials with a Pb-Free solder paste. Underfill formulations cured by anhydride, base, and acid were assessed for changes in reactivity in the presence of Pb-free solder paste residue. An analysis of commercial Pb-free solder paste was conducted, and the effect on underfill reactivity of the primary components was explored. Reliability tests were conducted to correlate effect of solder paste residue on reliability. It was found that some types of underfill chemistry are affected more than others by solder paste residues, but good reliability can still be obtained. It also was found that the underfill flux interaction can be managed by formulation.
机译:在这项研究中,我们检查了三种类型的底部填充材料与无铅焊膏的相互作用。通过酸酐,碱和酸固化的底部填充制剂在无铅焊膏残留物存在下进行反应性的变化。进行了对无铅焊膏的分析,探讨了对初级成分的欠换部反应性的影响。进行可靠性测试以与可靠性相关的焊膏残留物的效果。结果发现,一些类型的底部填充化学物质受到焊膏残留物的影响,但仍然可以获得良好的可靠性。还发现,可以通过配方管理底部填充磁通相互作用。

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