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RUTHENIUM DOPED INDIUM PHOSPHIDE GROWTH BY LOW PRESSURE HYDRIDE VAPOR PHASE EPITAXY

机译:通过低压氢化物气相外延掺杂钌掺杂磷化铟生长

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Ruthenium doped InP (InP:Ru) has been grown by low pressure hydride vapor phase epitaxy (LP-HVPE) using bis(η~5-2,4-dimethylpentadienyl) ruthenium(II) as precursor. Ruthenium concentrations in the range 2xl0~(15) to 2xl0~(18) cm~(-3) have been achieved. The Ru incorporation has been studied in terms of incorporation flux and it turns out that the growth rate is limiting the incorporation. From I-V measurements on n/InP:Ru/n and p/InP:Ru/p structures, resistivities ≥ 10~3Ωcm and ≥ 10~(10)Ωcm have been obtained, respectively.
机译:使用双(η〜5-2,4-二甲基戊二烯基)钌(II)作为前体,通过低压氢化物气相外延(LP-HVPE)生长钌掺杂INP(INP:Ru)。已经实现了2×10〜(15)至2xL0〜(18)cm〜(-3)范围内的钌浓度。已经在融合助焊剂方面研究了RU Incoration,事实证明,增长率限制了该掺入。从N / INP的I-V测量:RU / N和P / INP:RU / P结构,分别获得≥10〜3Ωcm和≥10〜(10)Ωcm的电阻。

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