首页> 外文会议>International Conference on Microelectronics >Partially depleted silicon-on-insulator (SOI): a device design/modeling and circuit perspective
【24h】

Partially depleted silicon-on-insulator (SOI): a device design/modeling and circuit perspective

机译:部分耗尽的绝缘体(SOI):设备设计/建模和电路透视图

获取原文

摘要

This paper reviews the evolution of partially depleted (PD) CMOS SOI technology at IBM. Several aspects of this development leading to successful fabrication of high-performance microprocessors are discussed. They include SOI-specific device design and process modifications; creation of compact device models for circuit simulation (SPICE-like models); and development of circuit styles and strategies employed in the design of CMOS VLSI on PD SOI. Since these strategies address issues and problems that arise on PD SOI circuits such as delay hysteresis and noise margin reduction, they are discussed in detail. Although many aspects of CMOS design pertaining to SOI are covered, emphasis is placed on dynamic and static circuits and high-performance SRAMs.
机译:本文评论了IBM处于部分耗尽(PD)CMOS SOI技术的演变。讨论了这种发展的几个方面,导致成功制造高性能微处理器。它们包括SOI特定的设备设计和过程修改;采用电路模拟的紧凑型器件模型(香料样型号); CMOS VLSI对PD SOI设计的电路样式和策略的发展。由于这些策略解决了PD SOI电路(例如延迟滞后和噪声裕度)而产生的问题和问题,它们将详细讨论。虽然覆盖了与SOI有关的CMOS设计的许多方面,但重点放置在动态和静态电路和高性能SRAM上。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号