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Chemical-mechanical polishing of tungsten: an electrophoretic mobility investigation of alumina-tungstate interactions

机译:钨的化学机械抛光:氧化铝 - 钨酸盐相互作用的电泳迁移率调查

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Electrophoretic mobility (zeta potential) measurement was used to investigate the interaction of tungstate ions and alumina particles in aqueous media. In the absence of tungstate ions, the isoelectric point (iep) of alumina was observed at pH 8.5. The iep shifted to lower pH values with increase in tungstate ion concentration. The alumina particles became negatively charged over the entire experimental pH range (>=pH3) when the tungstate concentration in the system was raised to 10~-5) M. The results suggest that tungstate ions are strongly chemisorbed by alumina and that adsorption may provide a pathway for metal removal during chemical mechanical polishing (CMP). Implications for colloidal stability in CMP systems and for post-CMP slurry treatment and recycle are discussed.
机译:电泳迁移率(Zeta电位)测量用于研究钨极离子和氧化铝颗粒在水性介质中的相互作用。在没有钨离子的情况下,在pH8.5下观察到氧化铝的等电点(IEP)。随着钨离子浓度的增加,IEP转移到较低的pH值。当系统中的钨浓度升至10〜-5)M时,氧化铝颗粒在整个实验pH范围(> = pH3)上被带负电。结果表明钨酸钨离子由氧化铝强烈化学吸附,吸附可提供化学机械抛光期间金属去除途径(CMP)。讨论了CMP系统中胶体稳定性和用于后CMP浆料处理和再循环的影响。

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