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Calibration of Equivalent Finite Element Model for Packaged Printed Circuit Board by Experimental Modal Analysis

机译:实验模态分析校准封装印刷电路板的等效有限元模型

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In this work, the experimental modal analysis (EMA) was performed to establish an equivalent finite element (FE) model for a standard JEDEC drop test printed circuit board (PCB) mounted with packages in a full array. Material properties of the equivalent FE model of the packaged PCB were calibrated through an optimization process with respect to natural frequencies based on EMA results obtained with a free boundary condition. The model was then applied to determine screwing tightness of the packaged PCB corresponding to a fixed boundary condition with the four corners of the PCB constrained, as defined by JEDEC for a board-level drop test.
机译:在这项工作中,执行实验模态分析(EMA)以建立一个等效的有限元(FE)模型,用于标准JEDEC跌落试验印刷电路板(PCB)安装有完整阵列的封装。通过基于具有自由边界条件获得的EMA结果,通过优化过程校准封装PCB等同Fe模型的材料特性。然后应用该模型以确定与固定边界条件相对应的封装PCB的拧紧密封性,其由PCB的四个角度受到限制,如JEDEC用于板级跌落测试。

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