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Finite Element Model Verification For Packaged Printed Circuit Board By Experimental Modal Analysis

机译:通过实验模态分析验证封装印刷电路板的有限元模型

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In this work, the experimental modal analysis (EMA) was performed to establish an equivalent finite element (FE) model for a standard Joint Electron Device Engineering Council (JEDEC) drop test printed circuit board (PCB) mounted with packages in a full array. Material properties of the equivalent FE model of the packaged PCB were calibrated through an optimization process with respect to natural frequencies based on EMA results obtained with a free boundary condition. The model was then applied to determine screwing tightness of the packaged PCB corresponding to a fixed boundary condition with the four corners of the PCB constrained, as defined by JEDEC for a board-level drop test. Modal damping ratios of the packaged PCB were also provided.
机译:在这项工作中,进行了实验模态分析(EMA),以建立标准的联合电子设备工程委员会(JEDEC)跌落测试印刷电路板(PCB)的等效有限元(FE)模型,并以完整的阵列形式安装了封装。通过基于自由边界条件获得的EMA结果,通过针对自然频率的优化过程,对封装PCB的等效FE模型的材料特性进行了校准。然后,使用该模型来确定与固定边界条件相对应的封装PCB的拧紧度,该约束条件限制了PCB的四个角,如JEDEC所定义的那样,用于板级跌落测试。还提供了封装PCB的模态阻尼比。

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