A high speed production die sort system for high gain MMICreceivers

摘要

A high-speed production die sort system developed for waferprobing of 12 GHz high-gain MMIC (monolithic microwave IC) receivers isdescribed. The purpose of the system is to reduce manufacturing costsand increase throughput by eliminating noncompliant die early in themanufacturing process. Another important function of the system is toautomatically provide process and design information which can be usedfor yield enhancement through design and process improvements. Over thecourse of production of the MMIC receiver, yields have more thandoubled, largely as a result of the die sort data that has been fed backto the engineering and manufacturing departments. The test time isreduced to three seconds per die, without sacrificing the accuracy ofthe measurement