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IMPROVED APPROACHES FOR FEA ANALYSES OF PBGA PACKAGES SUBJECTED TO THERMAL CYCLING

机译:PBGA封装受热循环影响的有限元分析方法的改进

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The study of solder joint reliability is one of the priority issues in electronic packaging. Solder alloys experience a highly nonlinear material behavior when subject to thermal cycling. It is a time consuming and difficult task to study the behavior of solder joints using experimental approaches. Finite element analysis provides a more efficient way to better understand the behavior of solder joints when accurate material models are available. With the developments of FEA algorithms and computer resources, the analysis approaches used for electronic packaging assemblies have evolved from 2-dimensional to 3-dimensional analyses, with far fewer assumptions needed in the fully 3D case. In this paper, we compare different FEA approaches covering various 2D and 3D modeling techniques to understand their advantages and drawbacks, especially as related to simulation accuracy and efficiency. Several models for a typical BGA assembly were prepared and analyzed including traditional mesh continuity models (2D slice model, 3D slice model, and 3D quarter model), as well as advanced models that employ Multi-Point Constraints (MPCs) and submodeling (global/local models). The Anand viscoplastic model was used for the solder joint material behavior in all of the FEA approaches. For the 3D mesh continuity models, an optimal analysis approach has been proposed to achieve the best balance between the accuracy of the simulation result and numerical efficiency of the simulation. Mesh transitions were used to maintain mesh continuity between regions of different mesh densities. A best choice of load step size was also found to reduce overall simulation time. For the analysis using MPCs to to bond different meshes, two improved modeling strategies have been proposed including a suggested ratio of contacting elements and the use of multiple-MPC contact pairs to reduce overall mesh density of the FE model. An improved simulation simulation strategy using submodeling has also been developed to obtain the best compromise in the global and local models between the mesh quality and load step size. An improved geometric simplification of the solder joint for use with energy based fatigue criteria was developed. Finally, comparisons and suggestions were made for the best analysis approach when using FEA techniques to predict the behavior of solder joints in PBGA packages.
机译:焊接接头可靠性的研究是电子封装中的首要问题之一。焊料合金在经受热循环时会经历高度非线性的材料行为。使用实验方法来研究焊点的行为是一项耗时且困难的任务。当可以使用精确的材料模型时,有限元分析提供了一种更有效的方法,可以更好地了解焊点的行为。随着FEA算法和计算机资源的发展,用于电子包装组件的分析方法已从二维分析演变为三维分析,而在全3D情况下所需的假设要少得多。在本文中,我们比较了涵盖各种2D和3D建模技术的不同FEA方法,以了解它们的优缺点,尤其是与仿真精度和效率有关的优缺点。准备并分析了用于典型BGA组件的几种模型,包括传统的网格连续性模型(2D切片模型,3D切片模型和3D四分之一模型),以及采用多点约束(MPC)和子模型的高级模型(全局/本地模型)。 Anand粘塑性模型用于所有FEA方法中的焊点材料性能。对于3D网格连续性模型,提出了一种优化分析方法,以在模拟结果的精度和模拟的数值效率之间达到最佳平衡。网格过渡用于维持不同网格密度区域之间的网格连续性。还找到了负载步长的最佳选择,以减少总体仿真时间。对于使用MPC粘合不同网格的分析,已提出了两种改进的建模策略,包括建议的接触元件比例和使用多个MPC接触对来降低FE模型的总体网格密度。还开发了一种改进的使用子模型的仿真模拟策略,以在网格质量和载荷步长之间的全局模型和局部模型中获得最佳折衷。已开发出一种基于能量疲劳标准的改进的焊点几何简化方法。最后,当使用FEA技术预测PBGA封装中焊点的行为时,提出了最佳分析方法的比较和建议。

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