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Opto-electronic hybrid integrated chip packaging technology for silicon photonic platform using gold-stud bump bonding

机译:用于硅光子平台的光电混合集成芯片包装技术,采用金螺柱凸块键合

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摘要

We propose a new solder-free and low-temperature (200 °C or less) flip-chip integration technology for silicon photonic platforms. Au stud bumps are arranged facing each other on a substrate and a chip. Plastic deformation when the bumps are heated and pressed achieves Au-Au bonding. We measured mechanical and electrical characteristics (bonding strength, electrical resistance, and high-frequency characteristics) of test samples fabricated by using this technology and confirmed good performance. Further, we fabricated a four-channel WDM receiver using this technology and confirmed its good performance at 25-Gbit/s operation.
机译:我们为硅光子平台提出了一种新的焊接和低温(200°C或更低)的倒装芯片集成技术。 Au螺柱凸块在基板和芯片上彼此面对面布置。加热凸块并压制时塑性变形实现了Au-Au键合。通过使用该技术制造的测试样品的机械和电气特性(粘接强度,电阻和高频特性)测量,并确认了良好的性能。此外,我们使用该技术制作了四通道WDM接收器,并在25-Gbit / s操作中确认了其良好性能。

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