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Graphene/silicon-quantum-dots/Si Schottky-PN cascade heterojunction for short-wavelength infrared photodetection

机译:石墨烯/硅量子点/ Si肖特基-PN级联异质结用于短波长红外光检测

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Due to limited short-wavelength infrared (SWIR) (1.1-2.5 μm) response of silicon (Si), germanium and indium-gallium-arsenide based photodetectors have dominated the commercial market of SWIR photodetectors for decades. However, they are often constrained by high-temperature processing, spectral range, flexible incompatibility, and cryogenic cooling accessories. Therefore, it is important to develop photodetectors that can be directly integrated with complementary-metal-oxide-semiconductor devices. In this work, we demonstrate a Si-based SWIR photodetector operating in the wavelength range from 800 to 1870 nm, with responsivity up to 0.6 A/W, and operation speed down to 15 p, s. By taking advantage of the fast photo-carriers transfer between graphene (Gr) and Si-quantum-dots (QDs), along with SWIR tunable Schottky-barrier height of Gr-Si junction, a novel Schottky-PN cascade heterojunction based photodetector has been demonstrated. The hyper-boron-doped SiQDs, interacting with the Gr-Si Schottky photodiode, effectively and fast harvest SWIR-excited charge-carriers. The cascade photodiode working at room temperature, with detectivity of 1011Jones and sensitivity of 10-13W/Hz05, manifests a promising prospect of our Si-based SWIR photodetector.
机译:由于硅(Si)的短波长红外(SWIR)(1.1-2.5μm)响应有限,基于锗和砷化铟镓镓的光电探测器已经在SWIR光电探测器的商业市场中占据主导地位。但是,它们通常受到高温处理,光谱范围,柔性不兼容以及低温冷却附件的限制。因此,开发可与互补金属氧化物半导体器件直接集成的光电检测器非常重要。在这项工作中,我们演示了一种基于Si的SWIR光电探测器,该探测器在800至1870 nm的波长范围内运行,响应度高达0.6 A / W,运行速度下降至15 p,s。通过利用石墨烯(Gr)和硅量子点(QDs)之间快速的载流子转移以及Gr-Si结的SWIR可调肖特基势垒高度,一种新颖的基于肖特基-PN级联异质结的光电探测器已经被开发出来。演示。高硼掺杂的SiQD与Gr-Si肖特基光电二极管相互作用,可以有效,快速地获得SWIR激发的电荷载流子。级联光电二极管在室温下工作,检出率为10 11 琼斯的敏感度为10 -13 瓦特/赫兹 05 ,显示了我们基于Si的SWIR光电探测器的广阔前景。

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