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Improvement in Photodetection Characteristics of Graphene/p-Silicon Heterojunction Photodetector by PMMA/Graphene Cladding Layer

机译:PMMA /石墨烯包覆层的石墨烯/ P硅杂旋转光电探测器的光电检测特性的改进

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This work evaluates the photodetection characteristics of graphene/p-silicon (Gr/p-Si) heterojunction photodetector having Polymethyl Methacrylate (PMMA) as cladding layer. The graphene film was deposited on copper (Cu) by using the atmospheric pressure chemical vapor deposition method, whereas the PMMA layer was deposited on the Gr/Cu by the spin coating technique. The fabricated heterojunction was characterized by Raman spectroscopy, UV-visible spectroscopy and field emission scanning electron microscopy. The photodetection characteristics of the heterojunction photodetector were assessed through a current-voltage digital source system (Keithley 2400). The results showed that the addition of PMMA/Gr layer to Gr/p-Si enhanced the photodetection performance of the device upon the incident of light emitting diodes with various wavelengths (395nm, 405nm, 470nm, 605nm, 625nm, 880nm and 940nm). Among all these wavelengths, light emitting diodes with 470 and 395nm wavelengths were found to display better photodetection performance. For the 470nm illumination case, the quantum efficiency and responsivity of the fabricated device were increased by approximate to 7 times, the sensitivity was increased by approximate to 12 times whereas the current gain was increased by approximate to 6 times. The enhancement of quantum efficiency and responsivity is attributed to the use of a PMMA/Gr layer that increased the light absorption, reduced the light reflectivity, changed the graphene band structures and decreased the device dark current. For the case of 395nm illumination at 5V, the gain was approximate to 9, the responsivity was approximate to 5.052 A/W and the quantum efficiency was approximate to 15.86W/A while the sensitivity at 4V was 650%.
机译:该作品评估石墨烯/ P硅(GR / P-Si)异质结光电探测器具有聚甲基丙烯酸甲酯(PMMA)作为包层的光电检测特性。通过使用大气压化学气相沉积方法将石墨烯膜沉积在铜(Cu)上,而通过旋涂技术将PMMA层沉积在GR / Cu上。通过拉曼光谱,UV可见光光谱和场发射扫描电子显微镜表征制造的异质结。通过电流 - 电压数字源系统(Keithley 2400)评估异质结光电探测器的光检测特性。结果表明,在具有各种波长(395nm,405nm,470nm,605nm,625nm,880nm和940nm)的发光二极管入射时,将PMMA / GR层加到GR / P-SI的光电检测性能增强了装置的光电检测性能。在所有这些波长中,发现具有470和395nm波长的发光二极管显示更好的光电探测性能。对于470nm的照明情况,通过近似为7次,制造装置的量子效率和响应度增加,近似值增加到12倍,而当前增益近似增加到6次。量子效率和响应性的增强归因于使用增加光吸收的PMMA / GR层,降低光反射率,改变了石墨烯带结构并降低了暗电流。对于5V的395nm照明的情况,增益近似为9,响应率近似为5.052 A / W,量子效率近似为15.86W / a,而4V的敏感性为650%。

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