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Study on electro-thermo-mechanical responses of bonding wires arrays used for the package design of LDMOSFET-based RF Amplifier

机译:基于LDMOSFET的RF放大器的封装设计中的键合线阵列的电热机械响应研究。

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This paper presents the study of electro-thermo-mechanical responses of bonding wire arrays used for the design of lateral double-diffused MOSFET-based RF amplifier. We at first show a series of ruggedness measurements of bonding wire arrays with a mismatch control system and an IR microscopy used for accurately predicting their surface temperatures. Further, an in-house time-domain finite element solver is employed for simulating the electro-thermo-mechanical responses of bonding wire arrays and their highest temperatures are captured and validated in comparison with those of commercial simulator COMSOL. Finally, an improved design of the bonding wire array is proposed and validated experimentally so as to get both uniform current and temperature distributions, and therefore, a significant improvement of the electrical performance of LDMOSFET RF PA is achieved as we expected.
机译:本文介绍了用于设计基于横向双扩散MOSFET的射频放大器的键合线阵列的电热机械响应。首先,我们展示了一系列带有不匹配控制系统和用于精确预测其表面温度的IR显微镜的键合线阵列的坚固性测量。此外,采用内部时域有限元求解器来模拟键合线阵列的电热机械响应,并与商用模拟器COMSOL的温度相比,捕获并验证了它们的最高温度。最后,提出并经过实验验证了键合线阵列的改进设计,以便获得均匀的电流和温度分布,因此,正如我们所期望的,LDMOSFET RF PA的电性能得到了显着改善。

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