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Study of Factors Contributing to Robust Copper Wire Bond on QFN

机译:QFN上强大铜线键合的因素研究

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Copper wire interconnect is gaining momentum in mass production at rapid speed as the industry continue to mature into more robust copper wire bond process capability and at the same time has realized its cost benefits over gold wire interconnect. QFN has been in mass production for longer period in industry to support trend towards smaller packaging technologies, replacing other lead frame base or even substrate base packaging solution at rapid speed. This paper discusses the holistic packaging solution approach towards developing copper wire bond on QFN, including the issues and challenges encountered during the development and implementation phases. It covers the process optimization based on various popular wafer fabrication metal structures in the industry, special consideration on factors affecting bond pad integrity, and impact of various lead frame surface finishes, and the implementation of process control to provide robust wire bond, and higher packaging reliability requirement for copper wire bond.
机译:随着行业继续成熟以更加强大的铜线键合工艺能力,铜线互连是在批量生产中获得批量生产的动力,同时实现了在金线互连上实现其成本效益。 QFN一直在批量生产,在工业中较长时期,以支持较小的包装技术的趋势,以快速速度替换其他引线框架底座甚至基板底座包装溶液。本文讨论了QFN上开发铜线键的整体包装解决方法,包括在开发和实施阶段遇到的问题和挑战。它涵盖了基于各种流行的晶片制造金属结构的过程优化,对影响粘接焊盘完整性的因素的特殊考虑,以及各种引线框架表面的影响,以及过程控制的实施提供强大的钢丝键,更高的包装铜线键合的可靠性要求。

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