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VOIDING CONTROL AT QFN ASSEMBLY

机译:QFN大会上的语音控制

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Quad Flat No Leads (QFN) package designs receive more and more attention in electronic industry nowadays. This package offers a number of benefits including (1) small size, such as a near die-sized footprint, thin profile, and light weight; (2) easy PCB trace routing due to the use of perimeter I/O pads; (3) reduced lead inductance; and (4) good thermal and electrical performance due to the adoption of exposed copper die-pad technology. These features make the QFN an ideal choice for many new applications where size, weight, electrical, and thermal properties are important. However, adoption of QFN often runs into voiding issues at SMT assembly. Upon reflow, outgassing of solder paste flux at the large thermal pad has difficulty escaping and inevitably results in voiding. It is well known that the presence of voids will affect the mechanical properties of joints and deteriorate the strength, ductility, creep, and fatigue life. In addition, voids could also produce spot overheating, lessening the reliability of the joints. This is particularly a concern for QFN where the primary function of thermal pads is for heat dissipation. Thermal pad voiding control at QFN assembly is a major challenge due to the large coverage area, large number of via, and low standoff. Both design and process were studied for minimizing and controlling the voiding. For an open via situation, a full thermal pad is desired for a low number of via. For a large number of via, a divided thermal pad is preferred due to better venting capability. Placement of a via at the perimeter prevents voiding caused by via. A wider venting channel has a negligible effect on voiding and reduces joint continuity. For divided thermal pad, the SMD system is more favorable than the NSMD system, with the latter suffering more voiding due to a thinner solder joint and possibly board outgassing. Performance of a divided thermal pad is dictated by venting accessibility, not by the shape. Voiding reduction increases with increasing venting accessibility, although introduction of a channel area compromises the continuity of solder joint. Reduced solder paste volume causes more voiding. Short profiles and long hot profiles are most promising in reducing the voiding. Voiding behavior of a QFN is similar to typical SMT voiding and increases with pad oxidation and further reflow.
机译:四边形没有引线(QFN)包装设计现在在电子行业中获得越来越多的关注。该封装提供了许多益处,包括(1)小尺寸,如近模尺寸的足迹,薄型和重量轻; (2)由于使用周边I / O焊盘而易于PCB跟踪路由; (3)减少铅电感; (4)由于采用暴露的铜模垫技术而良好的热电性能。这些功能使QFN成为许多新应用的理想选择,其中尺寸,重量,电气和热性能很重要。但是,通过QFN的采用经常运行到SMT组装的空中问题。在回流后,大型热焊盘上的焊膏通量的焊料粘贴通量的放入难以逸出,不可避免地导致排尿。众所周知,空隙的存在会影响关节的力学性质,并劣化强度,延展性,蠕变和疲劳寿命。此外,空隙还可以产生斑点过热,减少关节的可靠性。这尤其是QFN的关注,其中热焊盘的主要功能用于散热。 QFN组件的热焊盘空隙控制是由于大覆盖区域,大量通孔和低支座导致的主要挑战。研究了设计和过程,以最小化和控制排尿。对于通过情况开放的通孔,需要一个完整的热垫,但是较少的通孔。对于大量的通孔,由于更好的排气能力,优选分开的热焊盘。在周边处放置通孔可防止通过通孔引起的空隙。更广泛的通风通道对空隙的影响可忽略不计,减少了关节连续性。对于分开的热焊盘,SMD系统比NSMD系统更有利,由于焊接接头较薄,并且可能的载板放气,后者遭受更多的空隙。分开的热垫的性能通过通风可访问性而决定,而不是通过形状。空隙减少随着通风可访问性的增加而增加,尽管引入通道区域损害了焊点的连续性。减少的焊膏浆料卷导致更多的空隙。短型材和长的热型材在减少空缺方面最有希望。 QFN的空隙行为类似于典型的SMT空隙,并随焊盘氧化和进一步的回流增加。

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