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A Novel Approach to Optimizing Solder Reflow Process in Assembling PQFN Packages

机译:组装PQFN封装时优化回流焊工艺的新方法

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Solder void is a common defect during assembling Power Quad Flat No-lead (PQFN) packages. It is detrimental to the packages' feature of good power management and reliability performance and needs to be controlled within certain specification. Reflow process is well considered as critical to the solder void formation for a given solder paste. The transport index of reflow oven, which determines how solder paste are reflowed through solder reflowing process within the reflow oven, has therefore been optimized by a novel approach in this study.The underlying principle of the optimization is to find such a transport index that solder paste have a best possibility to experience homogeneous heat transfer during reflow phase of the whole reflow process. Different from the traditionally experimental trial and error, the present approach first predicts the optimal transport index by calculating the relative locations of lead frame (solder paste are dispensed on it) to the heating blocks of the reflow oven and the amount of heat input at different locations on the lead frame during the reflow phase. Then only necessary experiments are conducted to validate the prediction. As the theoretic calculations already screen out part of experiments that have to be conducted in the traditional trial and error, the present approach saves time and cost in practice.
机译:焊接空洞是组装Power Quad Flat No-lead(PQFN)封装时的常见缺陷。这不利于封装具有良好的电源管理和可靠性能的功能,因此需要将其控制在一定的规格范围内。对于给定的焊膏,回流工艺被认为对形成焊锡空隙至关重要。因此,通过本研究中的新方法优化了回流炉的运输指数,该运输指数决定了在回流炉内如何通过焊锡回流工艺来回流焊膏。 优化的基本原理是找到一种传输指数,使锡膏最有可能在整个回流过程的回流阶段经历均匀的热传递。与传统的实验反复试验不同,本方法首先通过计算引线框架(在其上分配了焊膏)相对于回流炉加热块的相对位置以及在不同位置输入的热量来预测最佳运输指数回流阶段在引线框架上的位置。然后,仅进行必要的实验以验证预测。由于理论计算已经筛选出必须在传统的反复试验中进行的部分实验,因此本方法可以节省实践中的时间和成本。

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