首页> 外文期刊>Microelectronics reliability >Optimization modeling of the cooling stage of reflow soldering process for ball grid array package using the gray-based Taguchi method
【24h】

Optimization modeling of the cooling stage of reflow soldering process for ball grid array package using the gray-based Taguchi method

机译:基于灰色Taguchi方法的球栅阵列封装回流焊接工艺冷却阶段的优化建模

获取原文
获取原文并翻译 | 示例

摘要

The current paper introduces an effective numerical technique for optimization of the cooling stage of reflow soldering process. The study aims to optimize the thermal stress of a solder joint and cooling rate of a ball grid array package using the gray-based Taguchi method. The current methodology comprised numerical techniques for computational fluid modeling of the internal flow in the reflow oven coupled with the structural heat modeling at the board and package levels. The Multi-physics Code Coupling Interface (MpCCI) was used as the coupling software. Various parameters, such as printed circuit board density, cooling temperature, inlet velocity, and conveyor speed, were considered. Nine simulated experiment runs based on Taguchi L_9 orthogonal arrays were performed. The optimal parameter settings for multiple performance characteristics were determined and compared with the single performance characteristic. From the analysis of variance (ANOVA) result, the most influential factor for the multiple performance characteristics was found to be the inlet velocity. Simulated experiment results showed that the performance characteristics during the cooling stage in the reflow oven obviously improved. The new approach greatly helps in reducing soldering defects and enhances solutions to lead-free reliability issues.
机译:本文介绍了一种有效的数值技术,用于优化回流焊接过程的冷却阶段。这项研究旨在使用基于灰色的Taguchi方法来优化焊点的热应力和球栅阵列封装的冷却速率。当前的方法包括用于对回流炉中内部流动进行计算流体建模的数值技术,以及在板级和封装级的结构热建模。多物理场代码耦合接口(MpCCI)被用作耦合软件。考虑了各种参数,例如印刷电路板密度,冷却温度,入口速度和输送机速度。基于Taguchi L_9正交阵列进行了9次模拟实验。确定了多个性能特征的最佳参数设置,并将其与单个性能特征进行比较。从方差分析(ANOVA)结果中,发现对多种性能特性影响最大的因素是进气速度。模拟实验结果表明,回流炉冷却阶段的性能特征得到明显改善。新方法极大地有助于减少焊接缺陷,并增强了针对无铅可靠性问题的解决方案。

著录项

  • 来源
    《Microelectronics reliability》 |2012年第6期|p.1143-1152|共10页
  • 作者单位

    School of Mechanical Engineering, Universiti Sains Malaysia, Engineering Campus, 14300 Nibong Tebal, Penang, Malaysia;

    School of Mechanical Engineering, Universiti Sains Malaysia, Engineering Campus, 14300 Nibong Tebal, Penang, Malaysia;

    Celestica (M) Sdn. Bhd., Industrial Technology Park, Kulim, Kedah, Malaysia;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号