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Wire bonding with Pd-coated copper wire

机译:与镀钯铜线的引线键合

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The last three years have seen an aggressive implementation of fine-pitch copper wire bonding in face of ever-increasing gold prices. Numerous technical hurdles associated with copper wire bonding have mostly been overcome. However, achieving process robustness equivalent to gold wire bonding is still challenging and requires enhanced manufacturing control procedures. Although the 2nd bond in copper wire bonding is generally very reliable, it often requires additional process steps, such as skidding or scrubbing motions. These processes require additional time and cause an overall reduction in wire bonder throughput. Pd-coated Cu wire is emerging as an alternative to bonding with bare Cu wire. While not quite achieving the same cost savings as bare copper wire, it offers the promise of a more robust bonding process. Being a noble metal, the Pd-coating prevents oxidation of the wire surface. This improves 2nd bond performance, increases shelf life and protects the wire against corrosion. Better 2nd bond performance may allow for faster 2nd bond processes in some applications and hence greater throughput relative to bare copper. The effect of the Pd on the first bond is less certain. While residual Pd on the ball surface may enhance adhesion by analogy to the improvement seen at 2nd bond, the distribution of the Pd on the surface and within the ball is generally not uniform. Cross-sectional analysis of free air ball formed under different EFO parameters revealed different Pd distribution within the ball with more non-uniform mixing and swirling structures at high EFO current settings. In addition, formation of Pd-Cu alloys in the ball will increase its hardness at high EFO settings compared to low settings and may in turn exacerbate damage to bond pads, which is already a problem in copper wire bonding. This paper compares the bonding performance of Pd-coated Cu wire to bare copper wire at both 1st and 2nd bond. Bond strengths and process window --are characterized. It is shown that Pd-coated wire can be successfully bonded using nitrogen rather than forming gas as the cover gas during ball formation. Bonding with nitrogen would partially recover the higher cost of the wire relative to bare Cu.
机译:在过去的三年中,面对不断上涨的金价,积极实施了细间距铜线键合。大多数与铜线键合相关的技术障碍已得到克服。然而,实现等同于金线键合的工艺鲁棒性仍然是挑战,并且需要增强的制造控制程序。尽管铜线键合中的第二键通常非常可靠,但它通常需要其他处理步骤,例如打滑或擦洗运动。这些过程需要额外的时间,并会导致引线键合机生产率的整体下降。镀钯铜线正在替代铜裸线。尽管不能完全实现与裸铜线相同的成本节省,但它提供了更强大的键合工艺的希望。作为贵金属,Pd涂层可防止导线表面氧化。这样可以提高第二键合性能,延长保质期并保护电线免受腐蚀。更好的第二键合性能可以在某些应用中实现更快的第二键合工艺,因此相对于裸铜而言,通量更高。 Pd对第一个键的影响尚不确定。尽管类似于第二键的结合,球表面上残留的Pd可能会增强附着力,但Pd在球表面和球内的分布通常并不均匀。在不同的EFO参数下形成的自由空气球的横截面分析表明,在高EFO电流设置下,球内Pd分布不同,混合和旋流结构更加不均匀。另外,与低设定相比,在高EFO设定下,球中Pd-Cu合金的形成将增加其硬度,并且反过来可能加剧对焊盘的损坏,这在铜线接合中已经是一个问题。本文比较了Pd包覆的Cu线和1 st 和2 nd 键在裸铜线上的键合性能。粘结强度和工艺窗口- -- 被表征。结果表明,在形成球的过程中,可以使用氮气而不是将气体作为覆盖气体来成功地包覆Pd涂层的焊丝。相对于裸露的铜,与氮的键合将部分地恢复导线的较高成本。

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