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Overview of wire bonding using copper wire or insulated wire

机译:使用铜线或绝缘线的引线键合概述

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摘要

Wire bonding using copper or insulated wire leads to many advantages and new challenges. Research is intensively performed worldwide, leading to many new findings and solutions. This article reviews recent advances in wire bonding using copper wire or insulated wire for advanced microelectronics packaging. Journal articles, conference articles and patents published or issued recently are reviewed. The benefits and problems/challenges related to wire bonding using copper wire or insulated wire such as wire open and short tail defects, poor bondability for stitch/wedge bonds, oxidation of Cu wire, and stiff wire on weak support structures, are briefly analyzed. A number of solutions to the problems and recent findings/developments related to wire bonding using copper wire or insulated wire are discussed. With the references provided, readers may explore more deeply by reading the original articles and patent documents.
机译:使用铜线或绝缘线的引线键合带来许多优势和新挑战。全球范围内都在进行大量研究,从而产生了许多新发现和新解决方案。本文回顾了使用铜线或绝缘线进行高级微电子封装的引线键合的最新进展。审查最近发表或发行的期刊文章,会议文章和专利。简要分析了与使用铜线或绝缘线进行引线键合有关的好处和问题/挑战,例如引线开路和短尾缺陷,针脚/楔形键合的可粘合性差,铜线的氧化以及弱支撑结构上的硬线。讨论了与使用铜线或绝缘线进行引线键合有关的问题和最新发现/发展的许多解决方案。利用提供的参考,读者可以通过阅读原始文章和专利文件来更深入地探索。

著录项

  • 来源
    《Microelectronics reliability 》 |2011年第1期| p.4-12| 共9页
  • 作者

    Z.W. Zhong;

  • 作者单位

    School of MAE. Nanyang Technological University. 50 Nanyang Avenue. Singapore 639798, Republic of Singapore;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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