Neutron and alpha particle-induced transients in 90 nm technology

机译：中子和α粒子诱导的90 nm技术瞬态

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Combinational logic soft errors are a major environment-related reliability issue in advanced CMOS processes. The key to determining logic soft error rates (SER) is detailed knowledge of neutron and alpha particle-induced single event transient (SET) puls

机译：组合逻辑软错误是高级CMOS流程中的主要与环境相关的可靠性问题。确定逻辑软错误率（SER）的关键是中子和α粒子诱导的单事件瞬态（设定）脉冲的详细知识

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《IEEE International Reliability Physics Symposium》|2008年||共4页
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作者
Narasimham B.; Gadlage M.J.; Bhuva B.L.; Schrimpf R.D.; Massengill L.W.; Holman W.T.; Witulski A.F.; Xiaowei Zhu; Balasubramanian A.; Wender S.A.;
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中图分类 O4-53;
关键词
CMOS logic circuits; alpha-particle effects; neutron effects; CMOS processes; alpha particle-induced single event transient pulse widths; logic soft error rates; neutron particle-induced single event transient pulse widths; alpha; neutron; pulse width; single even;

机译：CMOS逻辑电路;α-粒子效应;中子效应;CMOS过程;alpha粒子诱导的单个事件瞬态脉冲宽度;逻辑软错误率;中子粒子诱导的单个事件瞬态脉冲宽度;α;中子;脉冲宽度;单个甚至;

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专利

1. Assessing Alpha Particle-Induced Single Event Transient Vulnerability in a 90-nm CMOS Technology [J] . Gadlage M. J., Schrimpf R. D., Narasimham B., IEEE Electron Device Letters . 2008,第6期

机译：在90 nm CMOS技术中评估Alpha粒子引起的单事件瞬态漏洞
2. Characterization of Neutron- and Alpha-Particle-Induced Transients Leading to Soft Errors in 90-nm CMOS Technology [J] . Narasimham B., Gadlage M. J., Bhuva B. L., Device and Materials Reliability, IEEE Transactions on . 2009,第2期

机译：90nm CMOS技术中导致软错误的中子和α粒子诱导的瞬态的表征
3. Characterization of Digital Single Event Transient Pulse-Widths in 130-nm and 90-nm CMOS Technologies [J] . Narasimham B., Bhuva B. L., Schrimpf R. D., IEEE Transactions on Nuclear Science . 2007,第6期

机译：130 nm和90 nm CMOS技术中的数字单事件瞬态脉冲宽度的表征
4. Neutron and alpha particle-induced transients in 90 nm technology [C] . Narasimham B., Gadlage M.J., Bhuva B.L., IEEE International Reliability Physics Symposium . 2008

机译：中子和α粒子诱导的90 nm技术瞬态
5. Characterization of heavy-ion, neutron and alpha particle-induced single-event transient pulse widths in advanced CMOS technologies. [D] . Narasimham, Balaji. 2008

机译：先进CMOS技术中重离子，中子和α粒子诱导的单事件瞬态脉冲宽度的表征。
6. Breast Cancer MDA-MB-231 Cells Use Secreted Heat Shock Protein-90alpha (Hsp90α) to Survive a Hostile Hypoxic Environment [O] . Hangming Dong, Mengchen Zou, Ayesha Bhatia, -1

机译：乳腺癌MDA-MB-231细胞使用分泌的热激蛋白90alpha（Hsp90α）生存在敌对的低氧环境中
7. On the Feynman-alpha formula for fast neutrons [O] . Anderson, Johan, Pal, Lenard, Pazsit, Imre 2011

机译：关于快中子的Feynman-alpha公式
8. Neutron metrology file NMF-90. An integrated database for performing neutron spectrum adjustment calculations [R] . Kocherov, N. P. 1996

机译：中子计量文件NmF-90。用于执行中子频谱调整计算的综合数据库

Neutron and alpha particle-induced transients in 90 nm technology

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