Low-Power Weighted Pseudo-Random Test Pattern Generation for Launch-on-Capture Delay Testing*

摘要

A new weighted pseudo-random test generator called wPRPG is proposed for low-power launch-on-capture (LOC) transition delay fault testing. The low-power weighted PRPG is implemented by assigning different weights on the test enable signals and applying a gating technique. The new low-power PRPG can achieve much higher transition delay fault coverage in LOC delay testing than the conventional test-per-scan PRPG.