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A High Speed Low Voltage Latch Type Sense Amplifier for Non-Volatile Memory

机译:用于非易失性存储器的高速低压锁存型读出放大器

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A high speed low power modified latch type static sense amplifier design for current sensing in non-volatile memories is presented in this paper. The idea presented in this paper makes use of the fact that the scaling in technology introduces severe reliability issues in sensing circuits, due to device mismatches, which cause unpredictability in their performance metrics. In this paper, a detailed analysis on the proposed sense amplifier topology has been carried out by introducing variations in the threshold voltage of the devices to determine its impact on the performance metrics such as sensing delay, offset, and power. The proposed sense amplifier exhibits a worst case sensing delay of 0.946ns and allows operation at power supplies lower than 1.2V. This design is capable of working at a current offset of 1μA, consumes total power of 45.512μW at 27°C with an improvement of 32.6% in power consumption when compared to conventional designs.
机译:本文介绍了用于非易失性存储器电流检测的高速低功率改性锁定式静态读音放大器设计。本文提出的想法利用了技术中的缩放引起了传感电路的严重可靠性问题,由于设备不匹配,这导致其性能度量的不可预测性。在本文中,通过引入设备的阈值电压的变化来执行关于所提出的读出放大器拓扑的详细分析,以确定其对诸如感测延迟,偏移和功率的性能度量的影响。所提出的读出放大器具有最坏情况感测延迟为0.946ns,并且允许在低于1.2V的电源下操作。该设计能够在1μA的电流偏移下工作,与传统设计相比,在27°C下消耗45.512μW的总功率,提高功耗32.6%。

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