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Fabrication of deep vias/grooves as interconnection path by wet etching for wafer level packaging of GaAs based image sensor

机译:通过湿法刻蚀制造深通孔/沟槽作为互连路径,用于基于GaAs的图像传感器的晶圆级封装

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GaAs wet etching was utilized for through substrate vias/grooves fabrication in wafer level packaging of GaAs based image sensor. In this work, GaAs wet etching was carried out on (100)-oriented substrates with PR mask as well as SiO2 mask. Three kinds of etching system i.e. (A) 1H2SO4 + 8H2O2 + 1H2O, (B) 9H3PO4 + 1H2O2 + 20H2O, (C) 1K2Cr2O7 + 1HBr + 4CH3COOH are tested at room temperature. Mask pattern of different shapes, dimensions and orientations for vias and grooves were designed. The etching for deep grooves was also carried out on thinned GaAs/Glass bonding substrate from the back side of the device. And some critical issues and problems were also discussed.
机译:在基于GaAs的图像传感器的晶圆级封装中,GaAs湿法刻蚀用于贯穿衬底的通孔/凹槽制造。在这项工作中,在具有PR掩模以及SiO 2 掩模的(100)取向衬底上进行了GaAs湿法刻蚀。 (A)1H 2 SO 4 + 8H 2 O 2 + 1H 2 O,(B)9H 3 PO 4 + 1H 2 O 2 + 20H 2 O,(C)1K 2 Cr 2 O 7 + 1HBr + 4CH 3 COOH在室温下测试。设计了用于通孔和凹槽的不同形状,尺寸和方向的掩模图案。还从器件的背面在减薄的GaAs /玻璃键合衬底上进行了深沟槽的刻蚀。并且还讨论了一些关键问题。

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