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Experimental and Numerical Demonstration of Superior RBSOAs in 1.2 kV SiC Trench and SBD-integrated Trench MOSFETs

机译:1.2 kV SiC沟槽和SBD集成沟MOSFET中高级RBSOA的实验和数值演示

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In this study, we investigated the reverse bias safe operating areas (RBSOAs) of three types of state-of-the-art 1.2 kV SiC trench MOSFETs, through experiments and numerical simulations. The experimental results revealed that both SiC trench MOSFETs had significantly larger RBSOAs than a commercial 1.2 kV silicon trench field stop (FS) IGBT. And interestingly, unlike the short-circuit safe operating area (SCSOA), the RBSOA of the Schottky barrier diode-wall integrated trench MOSFET (SWITCH-MOS) was sufficiently large and roughly that of the trench MOSFETs without SBD integration (IE-UMOSFETs). Further, we found that SiC trench MOSFETs with extremely low on-resistance had a very wide RBSOA.
机译:在这项研究中,我们通过实验和数值模拟研究了三种类型最先进的1.2 kV SiC沟槽MOSFET的反向偏置安全操作区域(RBSOA)。 实验结果表明,两个SiC沟槽MOSFET比商业1.2 kV硅沟槽(FS)IGBT具有明显较大的RBSOA。 有趣的是,与短路安全操作区域(SCOA)不同,肖特基势垒二极管壁集成沟孔MOSFET(开关MOS)的RBSOA足够大,大致地在没有SBD集成的沟槽MOSFET(IE-UMOSFET)的情况下 。 此外,我们发现具有极低导通电阻的SiC沟槽MOSFET具有非常宽的RBSOA。

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