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Temperature dependence of luminescence decay time of InP quantum disks

机译:INP量子磁盘发光衰减时间的温度依赖性

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We measured temperature dependence of luminescence decay time of self-assembled InP dots in GaInP lattice-matched to GaAs. The radiative lifetime of InP-dot luminescence is independent of temperature below /spl sim/40 K, and is linear with temperature between /spl sim/40 and /spl sim/120 K. These two features in the two temperature regimes are characteristic of zero-dimensional and two-dimensional structures, respectively. This temperature behavior of the lifetime is thought to be caused by the disk-like shape of the InP dots; they have longer lateral widths than their heights, and thus have an intermediate character between zero-dimensions and two-dimensions.
机译:我们测量了GaInP晶格与GaAs中的自组装INP点的发光衰减时间的温度依赖性。 INP点发光的辐射寿命与低于/ SPL SIM / 40K的温度无关,并且在/ SPL SIM / 40和/ SPL SIM / 120K之间具有温度的线性。这两个特征在两个温度制度中是特征分别零维和二维结构。终身的这种温度行为被认为是由INP点的圆盘状形状引起的;它们具有比其高度更长的横向宽度,因此在零维和二维之间具有中间特征。

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