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Influence of Medium Dose Rate X and Gamma Radiation and Bias Conditions on Characteristics of Low-Dropout Voltage Regulators with Lateral and Vertical Serial PNP Transistors

机译:中剂量率X和γ辐射的影响和偏置条件对横向和垂直串行PNP晶体管的低蒸馏电压调节器特性

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Voltage regulators were exposed to the influence of medium dose rate X and gamma radiation, in two modes: without bias, and with bias and load Examined integrated circuits are representatives of low-dropout voltage regulators with lateral and vertical PNP transistor: LM2940 and L4940. Results of the experiment, including the change of serial transistor dropout voltage and maximum output current as a function of total ionizing dose of X and gamma radiation, were presented for Commercial-Off-The-Shelf lC's from two batches of each manufacturer.
机译:电压调节器暴露于介质剂量X和伽马辐射的影响,以两种模式:没有偏压,并且偏压和负载检查的集成电路是具有横向和垂直PNP晶体管的低压差电压调节器的代表:LM2940和L4940。 实验结果,包括串联晶体管辍学电压和最大输出电流的变化,作为X和伽马辐射的总电离剂量的函数,用于商业储物LC从每批各批次的每种制造商。

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