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Electrical Simulation of A Shielding Structure in 3D Package

机译:3D封装屏蔽结构的电气仿真

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Electromagnetic interference (EMI) has become a remarkable and negligible problem in SiP module. As package tend to higher density and smaller size, the electromagnetic environment become complex and severe. The shortening distance between different devices in SiP enhances the EMI between different devices. Shielding methods in SiP, especially in 3D package, are worth researching. In this paper, a conformai shielding structure with conductive adhesive is researched. The conductive adhesive is coated on the flip-chip dies and connected to ground plane on the top of the substrate. In order to research the shielding effectiveness of this shielding structure, we construct two models in the 3D full wave electromagnetic simulator HFSS, one with shielding structure, and the other without shielding structure. After simulation, we obtain the distribution and the value of the radiation field at 1mm above the flip-chip die. After analysis and calculation, we get the shielding effectiveness of 16-36dB at 1GHz and 20-48dB at 3GHz.
机译:电磁干扰(EMI)已成为SIP模块中的一个显着且可忽略的问题。随着包装倾向于更高的密度和更小的尺寸,电磁环境变得复杂和严重。 SIP中不同设备之间的缩短距离增强了不同设备之间的EMI。 SIP的屏蔽方法,特别是3D封装,值得研究。本文研究了具有导电粘合剂的ConformaI屏蔽结构。导电粘合剂涂覆在倒装芯片管芯上并连接到基板顶部的接地平面。为了研究这种屏蔽结构的屏蔽效果,我们在3D全波电磁模拟器HFS中构建了两个模型,一个带有屏蔽结构的型号,另一个没有屏蔽结构。在仿真之后,我们获得了倒装芯片管芯上方1mm处的辐射场的分布和值。在分析和计算后,我们在3GHz的1GHz和20-48db处获得16-36dB的屏蔽效率。

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