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Process integration of best in class specific-on resistance of 20V to 60V 0.18#x00B5;m bipolar CMOS DMOS technology

机译:具有20V至60V的一流导通电阻的工艺集成,0.18µm双极CMOS DMOS技术

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摘要

The evolution of Bipolar CMOS DMOS (BCD) technology leads in the improvement of design technology to produce better device performance with fabrication cost effectiveness as concerned. In this paper, 0.18µm BCD technology with linear p-top layer N-channel LDMOS structure from 20V to 60V is presented with best in class Ron for both N-channel and P-channel LDMOS compared to recent BCD technology works. The optimization of current gain of 20V BJT has been done by adjustment of emitter width and boron doping concentration of base with increasing of current gain up to ten times higher without significantly change the breakdown voltage.
机译:双极CMOS DMOS(BCD)技术的发展导致设计技术的改进,从而产生了具有制造成本效益的更好的器件性能。在本文中,与最近的BCD技术相比,具有0.18µm线性P顶层N沟道LDMOS结构从20V至60V的BCD技术在N沟道和P沟道LDMOS方面均具有同类最佳的Ron性能。通过调整发射极的宽度和基极的硼掺杂浓度来实现20V BJT电流增益的优化,同时将电流增益增加多达十倍,而不会显着改变击穿电压。

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