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Studies on various 2-metal chip-on-flex (COF) packaging methods

机译:各种2金属柔性芯片(COF)封装方法的研究

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Various chip-on-2-metal flex (2-metal COF) packaging methods using such as ACF and NCF adhesives, and AuSn metallurgical bonding methods, were investigated in terms of electrical characteristics, flip chip joint quality, and reliability performances. 2-metal flex substrate and test chip were designed to include different pitches, 35 um, 25 um, and 20 um pitch. Thermal cycling test (TC test, −40 °C ~ +125 °C, 1000 cycles), and high temperature storage test (HTS test, 125 °C, 1000 hrs) were conducted to verify reliability of the 2-metal COF packages by various bonding methods. All the COF packages showed good TC and HTS reliability, whereas electrically shorted joints were observed during reliability tests only at the 20 um pitch of ACF joints. Therefore, for less than 20 um pitch of 2-metal COF packages, NCF adhesives bonding and AuSn metallurgical bonding methods are recommended, while all the ACF and NCF adhesives bonding and AuSn metallurgical bonding methods can be applied for larger than 25 um pitch applications.
机译:在电气特性,倒装芯片接合质量和可靠性方面,研究了使用诸如ACF和NCF粘合剂之类的各种2对2金属挠性(2金属COF)封装方法以及AuSn冶金结合方法。 2种金属挠性基板和测试芯片的设计间距包括35 um,25 um和20 um。通过热循环测试(TC测试,−40°C〜+125°C,1000个循环)和高温存储测试(HTS测试,125°C,1000 hrs)进行了测试,以验证两种金属COF封装的可靠性:各种粘接方法。所有COF封装均显示出良好的TC和HTS可靠性,而在可靠性测试期间仅在20 um ACF焊点间距下观察到电短路接点。因此,对于间距小于20 um的2金属COF封装,建议使用NCF粘合剂键合和AuSn冶金键合方法,而所有ACF和NCF粘合剂键合和AuSn冶金键合方法都可以用于大于25 um间距的应用。

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