首页> 外文期刊>Microelectronics reliability >Studies on various chip-on-film (COF) packages using ultra fine pitch two-metal layer flexible printed circuits (two-metal layer FPCs)
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Studies on various chip-on-film (COF) packages using ultra fine pitch two-metal layer flexible printed circuits (two-metal layer FPCs)

机译:使用超细间距两金属层柔性印刷电路(两金属层FPC)研究各种膜上芯片(COF)封装

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摘要

Various fine pitch chip-on-film (COF) packages assembled by (1) anisotropic conductive film (ACF), (2) nonconductive film (NCF), and (3) AuSn metallurgical bonding methods using fine pitch flexible printed circuits (FPCs) with two-metal layers were investigated in terms of electrical characteristics, flip chip joint properties, peel adhesion strength, heat dissipation capability, and reliability. Two-metal layer FPCs and display driver IC (DDI) chips with 35 μm 25 μm, and 20 μm pitch were prepared. All the COF packages using two-metal layer FPCs assembled by three bonding methods showed stable flip chip joint shapes, stable bump contact resistances below 5 mΩ, good adhesion strength of more than 600 gf/cm, and enhanced heat dissipation capability compared to a conventional COF package using one-metal layer FPCs. A high temperature/humidity test (85 ℃/85% RH, 1000 h) and thermal cycling test (T/C test, -40 ℃ to + 125 ℃, 1000 cycles) were conducted to verify the reliability of the various COF packages using two-metal layer FPCs. All the COF packages showed excellent high temperature/humidity and T/C reliability, however, electrically shorted joints were observed during reliability tests only at the ACF joints with 20 μm pitch. Therefore, for less than 20 μm pitch COF packages, NCF adhesive bonding and AuSn metallurgical bonding methods are recommended, while all the ACF and NCF adhesives bonding and AuSn metallurgical bonding methods can be applied for over 25 μm pitch COF applications. Furthermore, we were also able to demonstrate double-side COF using two-metal layer FPCs.
机译:通过(1)各向异性导电膜(ACF),(2)非导电膜(NCF)和(3)使用精细间距柔性印刷电路(FPC)的AuSn冶金结合方法组装而成的各种精细间距薄膜上芯片(COF)封装对具有两种金属层的复合材料进行了电气特性,倒装芯片接合特性,剥离粘合强度,散热能力和可靠性方面的研究。准备了两金属层FPC和35μm,25μm和20μm间距的显示驱动器IC(DDI)芯片。与传统方法相比,所有使用通过三种键合方法组装的两金属层FPC的COF封装均表现出稳定的倒装芯片接合形状,低于5mΩ的稳定凸点接触电阻,超过600 gf / cm的良好粘合强度以及增强的散热能力使用单金属层FPC的COF封装。进行了高温/高湿测试(85℃/ 85%RH,1000 h)和热循环测试(T / C测试,-40℃至+ 125℃,1000次循环),以验证各种COF封装的可靠性,使用两层金属FPC。所有COF封装均表现出出色的高温/高湿和T / C可靠性,但是,在可靠性测试过程中,仅在间距为20μm的ACF接头处观察到电短路接头。因此,对于间距小于20μm的COF封装,推荐使用NCF粘合剂粘结和AuSn冶金粘结方法,而所有ACF和NCF粘合剂粘结和AuSn冶金粘结方法均可用于25μm间距COF应用。此外,我们还能够使用两层金属FPC演示双面COF。

著录项

  • 来源
    《Microelectronics reliability》 |2012年第6期|p.1182-1188|共7页
  • 作者单位

    Department of Materials Science and Engineering, KAIST, 335 Gwahak-Ro Yuseong-Gu, Daejeon 305-701, Republic of Korea;

    Department of Mechanical Engineering, KAIST, 335 Gwahak-Ro Yuseong-Gu, Daejeon 305-701, Republic of Korea;

    Department of Mechanical Engineering, KAIST, 335 Gwahak-Ro Yuseong-Gu, Daejeon 305-701, Republic of Korea;

    STEMCO, Ochang Scientific Industrial Complex, 1111-4 Namchon-ri, Oksan-Myun, Cheongwon-gun, ChungCheng Buk-do 363-911, Republic of Korea;

    Department of Materials Science and Engineering, KAIST, 335 Gwahak-Ro Yuseong-Gu, Daejeon 305-701, Republic of Korea;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
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