A 3DIC interconnect interface test and repair scheme based on Hybrid IEEE1838 Die Wrapper Register and BIST circuit

摘要

This paper proposes a test and repair scheme for 3DICs based on Hybrid IEEE1838 Die Wrapper Register(DWR) and Build In Self-Test(BIST) circuit, The fault location of interconnect interface is pointed out by BIST circuit automatically, and the repair is completed by Build In Self-Repair(BISR) circuit automatically. At the same time, DWR structure is designed to support combinational circuit around the interconnect interface, which can ensure the overall test coverage.