Self-contained built-in-self-test/repair transceivers for interconnects in 3DICs

摘要

In this paper, we propose self-contained built-in-self-test/repair (BIST/R) solutions to improve the reliability of the direct face-to-face copper thermo-compression bonding A dual-mode transceiver is presented to operate either as an ohmic mode when the bonding has low resistance or as a capacitive coupling mode when the bonding is faulty showing high resistance.