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The effect of leadframe finishing towards package delamination

机译:引线框精加工对封装分层的影响

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Package reliability depends on the integrity of the interface between various materials. Key interfaces are between epoxy-based mold compound to leadframe and chip surfaces. In the present work, the adhesion of epoxy-based mold compound and copper leadframe with various finishing is being discussed. It is observed that dendrite like feature on the leadframe finishing is critical to prevent delamination between the molding compound to leadframe.
机译:封装的可靠性取决于各种材料之间接口的完整性。关键界面位于环氧树脂基模塑料与引线框和芯片表面之间。在当前的工作中,正在讨论环氧树脂基模塑料和铜引线框架在各种表面处理下的粘合性。可以观察到,引线框精加工上的类似枝晶的特征对于防止模塑料与引线框之间的分层至关重要。

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