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Deep Reactive Ion Etching of Quartz Crystal for Frequency Metrology

机译:石英晶体的深度反应离子刻蚀,用于频率计量

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High speed directional etching of piezoelectric material is still insufficiently developed for producing high aspect ratio microstructures. The ability to realize well-defined structures on the surface of the substrates, with almost vertical side walls, a high aspect ratio, and a relatively low surface roughness, is a key factor for many applications, micro-electromechanical systems, integrated optical devices or Bulk Acoustic Waves resonators for Ultra Stable Oscillators.Current manufacturing technology for quartz BAW resonators does not allow reducing the size and the manufacturing cost in maintaining the ultimate performances (short term stability, long term aging, low acceleration sensitivity...). To achieve collective machining, we performed chemical etching up to now. Unfortunately, the etching rate and the surface roughness strongly depend on the plate orientation. For instance, for the crystallographic orientation commonly used to perform Ultra Stable Resonators (called SC-cut), the surface quality deteriorates sharply with time (differently on the 2 surfaces). Furthermore, the shape of the sidewalls is also orientation dependent.In this paper, we report on deep reactive ion etching of quartz crystal. We give results about the etched rate and the etched depth, the shape of the sidewalls, and especially the quality of the etched surface.
机译:压电材料的高速定向蚀刻仍不足以开发出高纵横比的微结构。在几乎垂直的侧壁,高纵横比和相对较低的表面粗糙度的基板表面上实现定义明确的结构的能力,对于许多应用,微机电系统,集成光学器件或其他应用而言,都是至关重要的因素。超稳定振荡器的体声波谐振器。 石英BAW谐振器的当前制造技术不允许在保持最终性能(短期稳定性,长期老化,低加速度灵敏度...)的同时减小尺寸和制造成本。为了实现集体加工,到目前为止,我们已经进行了化学蚀刻。不幸的是,蚀刻速率和表面粗糙度在很大程度上取决于板的取向。例如,对于通常用于执行超稳定谐振器的晶体学取向(称为SC切割),表面质量会随时间急剧下降(在两个表面上有所不同)。此外,侧壁的形状也取决于取向。 在本文中,我们报道了石英晶体的深反应离子刻蚀。我们给出有关蚀刻速率和蚀刻深度,侧壁形状,尤其是蚀刻表面质量的结果。

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