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Analysis of lossy packaging parasitics for common emitter LNA in system-on-package

机译:系统级封装中常见发射极LNA的有损封装寄生效应分析

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Advances of VLSI and packaging technologies enable condensed integration of an RF system in a single module, known as SoC and SoP. In order to find a better solution between SoC and SoP for RF systems and their sub-systems, it is needed to predict and estimate the performance of each solution. Analytical equations for noise figure and gain of inductively degenerated common-emitter low-noise amplifiers in SoP/SoC are deduced as functions of passives and packaging parasitics. They hence enable designers to evaluate overall performance of each solution quantitatively. Influence of lossy packaging parasitics on LNA is also analyzed.
机译:VLSI和封装技术的进步使RF系统可以在单个模块(称为SoC和SoP)中进行紧凑的集成。为了在SoC和SoP之间为RF系统及其子系统找到更好的解决方案,需要预测和估计每个解决方案的性能。推导了SoP / SoC中电感退化的共发射极低噪声放大器的噪声系数和增益的解析方程,作为无源和封装寄生函数。因此,它们使设计人员能够定量评估每种解决方案的整体性能。还分析了有损封装寄生效应对LNA的影响。

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