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Ultra Low Alpha Emission Lead Free Solder for Flip Chip Bumps

机译:超低alpha排放引线免费焊料用于倒装芯片凸块

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Recently the change to flip chips is proceeding with the growth of high pin count integrated circuits. The flip chip forms a direct solder bump contact between the chip and the substrate, so soft errors can easily occur if the solder contains alpha emitters. A reduction of alpha emission from the bumps is needed more and more as integrated circuits become more sensitive to soft errors. Mitsubishi Materials developed low alpha emission solders over 20 years ago and now manufactures materials for all bumping methods: ball mounting, plating, printing, vacuum evaporation, etc. These have usually been lead-tin solder alloys. The alpha level is typically 0.02 cph/cm~2 and is trending to 0.01 cph/cm~2. Lead free solders are the latest industry trend. For use in flip chip bumps, they will need to be made from materials free of alpha emitters and demonstrating very low alpha flux levels. Even though the solder is "lead free," these alloys are not alpha free and the main cause of alpha emission is still ~(210)Po, the decay product of ~(210)Pb, present as raw material impurity in tiny amounts. It would seem that these impurities can be easily removed by chemical refining and, indeed, this can lead to a low initial alpha measurement immediately after refining. In fact, the alpha ray flux of alpha free solder just after refining is low ,but it can exhibit a time dependant alpha flux that grows over time to unacceptably high levels and to soft error problems. In this paper we describe lead free, tin based solders that have an ultra low alpha ray level at the detection limit (about 0.001 cph/cm~2) and no time variation of alpha ray flux.
机译:最近,翻转芯片的变化正在进行高引脚数集成电路的增长。倒装芯片在芯片和基板之间形成直接焊料凸块接触,因此如果焊料包含α发射器,则可以容易地发生软误差。随着集成电路对软误差更敏感,需要越来越多地需要从凸块的α发射的减少。三菱材料在20年前开发出低的alpha排放焊料,现在为所有碰撞方法制造材料:球安装,电镀,印刷,真空蒸发等。这些通常是铅锡焊料合金。 α水平通常为0.02cph / cm〜2,并且趋向于0.01cph / cm〜2。无铅焊料是最新的行业趋势。用于倒装芯片凸块,它们需要由无α发射器的材料制成并展示非常低的α通量水平。即使焊料是“无铅,”这些合金也不是无α,α发射的主要原因仍然〜(210)Po,〜(210)Pb的腐烂产物,作为原料杂质以微量的杂质。似乎这些杂质可以通过化学精炼容易地除去,并且实际上,这可以在精炼后立即导致低初始α测量。事实上,在精炼后的α游离焊料的α射线通量低,但它可以表现出时间依赖性α通量,这些α通量随着时间的推移而变化,以不可接受的高水平和软误差问题。在本文中,我们描述了在检测极限(约0.001cph / cm〜2)处具有超低α射线水平的无铅锡的焊料,并且无α射线通量的时间变化。

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