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Dependence of aging on inhomogeneities in InGaN/AlGaN/GaN light-emitting diodes

机译:老化对Ingan / AlGaN / GaN发光二极管的不均匀性的依赖性

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Changes of properties of green LEDs based on In{sub}xGa{sub}(1-x)N/Al{sub}yGa{sub}(1-y)/GaN heterostructures were studied during 150÷200 hours at currents I = 30÷80 MA. The radiation intensity at low currents (0.1÷1mA) is quite sensitive to such an aging, it falls down 10÷100 times. Quantum efficiency and spectral parameters at normal currents (J≈10 mA) change non-monotonically during aging, some degradation is observed after 168 hours. The degradation is observed also after a short (<1 min) period of reverse current. These phenomena are discussed in terms of under threshold defect's formation and their migration in the space charge region of p-n-heterojunction. Potential fluctuations in the space charge region are quite sensitive to this process.
机译:基于{sub} XGA {sub}(1-x)n / al {sub} yga {sub}(1-y)/ gaN异质结构的绿色LED的性能变化在电流下在150÷200小时期间研究了I = 30÷80 mA。低电流下的辐射强度(0.1‰1mA)对这种老化非常敏感,它落下10°100次。在衰老期间,普通电流(J≈10mA)的量子效率和光谱参数在老化期间不单调地改变,在168小时后观察到一些降解。在反向电流的短(<1分钟)时段之后,也观察到劣化。这些现象是根据阈值缺陷的形成及其在P-N-异质结的空间电荷区域的迁移方面讨论的。空间电荷区域的潜在波动对该过程非常敏感。

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