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Fabrication of silicon strip detectors using a step-and-repeat lithography system

机译:使用步进重复光刻系统制造硅带检测器

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The author describes the use of a step-and-repeat lithography system (stepper) for the fabrication of silicon strip detectors. Although the field size of the stepper is only 20 mm in diameter, much larger detectors have been fabricated by printing a repetitive strip detector pattern in a step-and-repeat fashion. The basic unit cell is 7 mm in length. The stepper employs a laser interferometer for stage placement, and the resulting high precision allows one to accurately place the repetitive patterns on the wafer. A small overlap between the patterns ensures a continuous strip. A detector consisting of 512 strips on a 50 mu m pitch has been fabricated using this technique. The dimensions of the detector are 6.3 cm by 2.56 cm. Yields of over 99% have been achieved, where yield is defined as the percentage of strips with reverse leakage current below 1 nA.
机译:作者介绍了使用步进重复光刻系统(步进器)制造硅条检测器的方法。尽管步进器的场尺寸直径仅为20 mm,但是通过以步进重复的方式打印重复的条形检测器图案,可以制造出更大的检测器。基本单位电池的长度为7毫米。步进器采用激光干涉仪进行平台放置,所产生的高精确度使人们可以将重复的图案准确地放置在晶圆上。图案之间的小重叠可确保连续的条带。使用这种技术已经制造出了由间距为50微米的512条带组成的检测器。检测器的尺寸为6.3厘米乘2.56厘米。已经实现了超过99%的良率,其中良率定义为反向漏电流低于1 nA的带材的百分比。

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