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Understanding the Impact of Accelerated Temperature Profiles on Lead-Free Soldering

机译:了解加速温度曲线对无铅焊接的影响

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Traditional reflow profiles for lead-free soldering typically require longer processing times due to elevated peak temperatures and flux activation times defined by solder paste suppliers. These profiles become particularly challenging when a wide variety of packaging types are integrated within a single circuit design. Further difficulty is presented when product designs with high thermal mass, such as heat slugs and metal substrates, are processed. These designs create large thermal gradients throughout a circuit assembly and add further complexity to finding an "optimal" profile window. All of these issues create a significant increase in reflow processing times for lead-free soldering. This paper investigates these increased processing times required for high volume manufacturing of lead-free electronics. A study of typical process capacity and real throughput capacity is presented. The study evaluates high volume electronics manufacturing ranging from small circuit assemblies (e.g. cell phone) to large circuit assemblies (e.g. automotive and computers) and investigates a series of "best" reflow profiles to accelerate the standard lead-free process window to meet a targeted manufacturing capacity using an automated profiling system. A test vehicle is then fabricated using this defined process window and tested for quality (solder voiding and appearance) and solder joint reliability (accelerated life testing). The designed test vehicle includes components from a large physical distribution including: small and large BGAs, QFNs, and any type discrete components. During assembly, virtual profiling is used to document any deviations to the process profile window. The quality and reliability data are presented within this publication and failure analysis is included to determine the capability of this proposed profile. When employed, this profiling strategy allows many manufacturers to reduce the processing time for reflowing lead-free circuit assemblies without significant lost in manufacturing quality or reliability. Furthermore, this study provides a sound understanding and limitations for using accelerated profiling speeds for lead-free soldering applications.
机译:传统的无铅焊接回流曲线通常需要更长的处理时间,这是由于焊膏供应商规定的升高的峰值温度和助焊剂激活时间所致。当将多种封装类型集成到单个电路设计中时,这些配置文件特别具有挑战性。当加工具有高热质量的产品设计(例如散热块和金属基材)时,会遇到进一步的困难。这些设计会在整个电路组件中产生较大的热梯度,并进一步增加查找“最佳”轮廓窗口的复杂性。所有这些问题大大增加了无铅焊接的回流处理时间。本文研究了大量生产无铅电子产品所需的增加的处理时间。提出了对典型处理能力和实际吞吐能力的研究。该研究评估了从小型电路组件(例如手机)到大型电路组件(例如汽车和计算机)的大批量电子制造,并研究了一系列“最佳”回流曲线,以加速标准无铅工艺窗口的实现,从而达到目标使用自动配置文件系统的制造能力。然后,使用此定义的过程窗口制造测试工具,并测试其质量(焊料空洞和外观)和焊点可靠性(加速寿命测试)。设计的测试工具包括来自大型物理分布的组件,包括:小型和大型BGA,QFN和任何类型的分立组件。在组装过程中,虚拟配置文件用于记录对过程配置文件窗口的任何偏差。质量和可靠性数据在此出版物中提供,并且包括故障分析以确定此建议配置文件的功能。当采用这种配置策略时,许多制造商可以减少回流无铅电路组件的处理时间,而不会明显降低制造质量或可靠性。此外,这项研究为在无铅焊接应用中使用加速的成型速度提供了良好的理解和限制。

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