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Board Level Assembly and Rework Assessment of Thin Substrate Chip Scale Package (tsCSP), a Multi-Row Leadless Package

机译:薄基板芯片级封装(tsCSP)(多行无铅封装)的板级组装和返工评估

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In recent years, Quad Flat No-lead (QFN) packages have gained rapid industry acceptance due to their compact size combined with superior electrical and thermal characteristics. Just as the industry becomes accustomed to the standard Leadframe-based QFN devices, the need for higher performance leadless packages are emerging. The Thin Substrate Chip Scale Package (tsCSP) is a leadless multi-row packaging solution that offers design flexibility and accommodates more I/Os than typical QFN devices. It also provides an isolated power/ground ring option for enhanced electrical characteristics. This paper will focus on the surface mount assembly aspect of this leadless package. It will provide guidelines for board level assembly and rework processes, based on extensive surface mount experiments. A 10 mm, 200 I/O, 0.5 mm pitch (both in X and Y direction), 3-row version of the tsCSP package was considered for this evaluation. X-ray inspection and cross-section results were analyzed to understand the influence of various design and process parameters on solder joint standoff height and voiding. Both aqueous and no-clean lead-free solder paste chemistries were evaluated. Challenges and concerns related to cleaning underneath these low profile parts will also be discussed.
机译:近年来,四方扁平无铅(QFN)封装由于其紧凑的尺寸以及出色的电气和热学特性而获得了业界的迅速认可。正如业界已习惯基于标准Leadframe的QFN器件一样,对更高性能的无铅封装的需求也在不断涌现。薄基板芯片级封装(tsCSP)是一种无引线的多行封装解决方案,与典型的QFN器件相比,它提供了设计灵活性并容纳了更多的I / O。它还提供了隔离的电源/接地环选件,以增强电气特性。本文将重点介绍这种无铅封装的表面安装组装方面。它将基于广泛的表面贴装实验为电路板级组装和返工过程提供指导。此评估考虑了tsCSP封装的10mm,200 I / O,0.5mm间距(沿X和Y方向),3行版本。分析了X射线检查和横截面结果,以了解各种设计和工艺参数对焊点间距和空隙的影响。评估了水性和免清洗无铅焊锡膏的化学性质。还将讨论与这些低轮廓部件下方清洁相关的挑战和担忧。

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