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Evaluation of Irregular Inter-Metallic Compound Growth in Gold Wire Bonds Encapsulated with Reliable, Green Epoxy Molding Compound

机译:用可靠的绿色环氧模塑化合物包封的金线键合中不规则金属间化合物的生长评估

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摘要

The thermal stability of selected additives used in epoxy mold compound is evaluated using thermo-gravimetric analysis. Certain additives degrade at lead-free reflow temperature as well as high temperature storage exposure at 175 deg C. The influence of such additives used in epoxy mold compound on gold-aluminum inter-metallic compound formation has been studied. Plastic ball grid array test package encapsulated with thermally unstable additives show trace elements from the degraded additive when analyzed by scanning electron microscopy and energy dispersive x-ray analysis. The element ingress and reside on the non-bonded regions of the ball bonds with increasing high temperature exposure. As the bonded regions remain free of the degraded elements,regular growth of inter-metallic compound progress while inter-metallic compound formation is retarded at non-bonded regions contaminated with trace elements. The resulting morphology after extended high temperature storage exposure shows voids that coalescence into a series of micro cracks. Thermally stable additives are found to be critical in ensuring green,reliable epoxy mold compound fulfilling the qualification requirements of ultra fine pitch integrate circuit package. Evidence of this being further validated with Quad Flat No-Lead package.
机译:使用热重分析法评估在环氧模塑料中使用的所选添加剂的热稳定性。某些添加剂在无铅回流温度下以及在175摄氏度的高温存储暴露下会降解。已研究了环氧模塑料中使用的此类添加剂对金铝金属间化合物形成的影响。当用扫描电子显微镜和能量色散X射线分析法分析时,封装有热不稳定添加剂的塑料球栅阵列测试包装显示出降解的添加剂中的微量元素。随着高温暴露的增加,元素进入并驻留在球形键合的非键合区域上。由于键合区域保持无降解元素,金属间化合物的规则生长得以进行,而金属间化合物的形成在被痕量元素污染的非键合区域受到阻碍。延长的高温存储暴露后所得到的形态显示出空隙,这些空隙聚结成一系列的微裂纹。发现热稳定的添加剂对于确保绿色,可靠的环氧模塑化合物满足超细间距集成电路封装的合格要求至关重要。 Quad Flat No-Lead套件进一步证明了这一点。

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