Automated Resource-Oriented Fault Injection to Estimate the SEU-induced Error in SRAM-based FPGA

摘要

Single-event upsets (SEUs) occur frequently since reconfigurable SRAM-based FPGAs are highly susceptible to radiation in space applications. The current fault injection techniques simulated SEU faults are used to evaluate the reliability of whole system but not a part. In this paper, a new resource-oriented method is proposed to inject faults into specific FPGA resource, especially routing source. We decode the relationship between a programmable resource and corresponding control bit creatively which is stored in a database. After that, an SEU fault list is established according to the resource type including critical logic nodes and paths, which could destroy the circuit topological structure. The control experiment is carried to validate resource-oriented approach and the result can be used to represent the reliability of the system and calculate failure rate of specific resource.