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Photoluminescence in strain compensated Si/sigec multiple quantium wells

机译:应变补偿Si / sigec多量子阱中的光致发光

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The effect of strain compensation on the band gap and band alignment of Si/SiGeC MQWs is studied by photoluminescence (PL) spectroscopy. Evidence for type-I band alignment of strain reduced SiGeC MQWs infound. Values for the conduction and valence bnad offsets are given. A band gap reduction for exactly strain compensated SiGeC compared to compressive SiGeC is observed. This behavior is interpreted in terms of strain induced splitting and confinement shifts of the quantum well states. A good agreement between the model and the PL data is obtained.
机译:通过光致发光(PL)光谱研究了应变补偿对Si / SiGeC MQWs的带隙和能带排列的影响。应变的I型带对齐的证据减少了SiGeC MQW的内在。给出了导纳和价位bnad偏移的值。观察到与压缩SiGeC相比,精确补偿应变的SiGeC的带隙减小。这种行为是根据应变诱导的量子阱态分裂和约束位移来解释的。模型与PL数据之间取得了良好的一致性。

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