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Thermal-Mechanical Failure and Life Analysis on CBGA Package used for Great Scale FPGA Chip

机译:用于大规模FPGA芯片的CBGA封装的热机械故障和寿命分析

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CBGA (Ceramic Ball Grid Array) is one kind of advanced package for FPGA, which can fulfill the demands of high interconnect density, high thermal and electronic performance, high chip-assembling yields, high reliability. But in multiple loading environments, CBGA has the invalidation mode of solder joint thermal-mechanical failure, which will influence the long term reliability of FPGA circuits. But there is few research on the China native made CBGA package. In this paper research of finite element analysis and solder joint fatigue predictive equation have been made on some of CBGA packages, and some failure prediction and ATC test results have been given.
机译:CBGA(Ceramic Ball Grid Array,陶瓷球栅阵列)是一种用于FPGA的高级封装,可以满足高互连密度,高热电性能,高芯片组装良率,高可靠性的要求。但是在多负载环境下,CBGA具有焊点热机械失效的失效模式,这将影响FPGA电路的长期可靠性。但是,关于中国本地制造的CBGA封装的研究很少。本文对某些CBGA封装进行了有限元分析和焊点疲劳预测方程的研究,并给出了一些故障预测和ATC测试结果。

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