首页> 外文会议>Electronic Components Technology Conference, 1998. 48th IEEE >Electrical evaluation of flip-chip package alternatives for next generation microprocessors
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Electrical evaluation of flip-chip package alternatives for next generation microprocessors

机译:下一代微处理器的倒装芯片封装替代品的电气评估

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Two styles of flip-chip packages for next-generation microprocessors were designed: a low-cost organic ball-grid-array (BGA) and a thin-film-on-ceramic land-grid array (LGA). Simultaneous switching output (SSO) noise, and core noise were measured. Although SSO was improved by a factor of two over the previous generation of packaging, core noise was still quite significant. We found that core noise is best managed by placing low-inductance capacitance close to the noise source, i.e. using on-chip capacitors, coupled planes in the package, or on-package bypass capacitors. Because of the lower impedance of its power planes, the ceramic package showed significantly better electrical performance than the organic. Addition of on-package bypass capacitors greatly narrows the gap between the two packages.
机译:为下一代微处理器设计了两种样式的倒装芯片封装:低成本有机球栅阵列(BGA)和薄膜陶瓷薄膜栅阵列(LGA)。测量了同时开关输出(SSO)噪声和铁芯噪声。尽管SSO与上一代封装相比提高了两倍,但核心噪声仍然非常显着。我们发现通过将低电感电容放置在靠近噪声源的地方来最好地管理核心噪声,即使用片上电容器,封装中的耦合平面或封装上旁路电容器。由于其电源层的阻抗较低,因此陶瓷封装的电性能明显优于有机封装。封装内旁路电容器的添加极大地缩小了两个封装之间的间隙。

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