首页> 外国专利> DUMMY CHIP WITH BUMP AND METHOD OF EVALUATING FLIP-CHIP PACKAGING

DUMMY CHIP WITH BUMP AND METHOD OF EVALUATING FLIP-CHIP PACKAGING

机译:带缓冲的假芯片和倒装芯片包装的评估方法

摘要

PROBLEM TO BE SOLVED: To evaluate a flip-chip packaging process by a simple method and in a short time. ;SOLUTION: A process of flip-chip packaging an LSI chip with bumps on a wiring board is evaluated by: conducting a flip-chip packaging trail by using a dummy chip 1 with bumps, which is made of transparent glass and has the same size and shape as an LSI chip of a product and in which the same bumps 4 as the bumps of the product are formed on one surface in the same arrangement and via the same underlying metal film 2 as the LSI chip with bumps of the product, and visually observing the bonding portions of the trial product and their peripheral portions through the dummy chip 1 to check the positioning accuracy of bonding and the connection shapes of the bumps.;COPYRIGHT: (C)2001,JPO
机译:解决的问题:通过一种简单的方法并在短时间内评估倒装芯片封装工艺。 ;解决方案:通过以下方法评估倒装芯片封装工艺的LSI芯片在电路板上的过程:使用带凸点的虚拟芯片1进行倒装芯片封装工艺,该芯片由透明玻璃制成并且尺寸相同。形状和形状与产品的LSI芯片相同,其中与产品的凸块相同的凸块4以与具有产品的凸块的LSI芯片相同的布置和相同的基底金属膜2形成在一个表面上,并且通过虚拟芯片1肉眼观察试验产品的结合部分及其周边部分,以检查结合的定位精度和凸块的连接形状。;版权所有:(C)2001,JPO

著录项

  • 公开/公告号JP2001068514A

    专利类型

  • 公开/公告日2001-03-16

    原文格式PDF

  • 申请/专利权人 FUJITSU LTD;

    申请/专利号JP19990242263

  • 发明设计人 KOYAMA SHIGEAKI;

    申请日1999-08-27

  • 分类号H01L21/60;H01L21/56;H05K1/18;

  • 国家 JP

  • 入库时间 2022-08-22 01:33:14

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